www.德州仪器.com
ABSOLUTEMAXIMUMRATINGS
(1)
T运算 view
1
2
3
5
4
输出
−
V
CC
V
REF
+V
CC
在
一个WO
1
2
3
5
4
管脚 方向/包装 标记
SOT23−5
x1
x1
200
Ω
50k
Ω
50k
Ω
1
2
3
4
8
7
6
5
+V
CC
NC
NC
在
输出
NC
V
REF
−
V
CC
SO−8
NC = 非 连接
x1
x1
200
Ω
50k
Ω
50k
Ω
BUF602
SBOS339–OCTOBER2005
thisintegratedcircuitcanbedamagedbyesd.texasinstrumentsrecommendsthatallintegrated
circuitsbehandledwithappropriateprecautions.failuretoobserveproperhandlingandinstallation
procedurescancausedamage.
esddamagecanrangefromsubtleperformancedegradationtocompletedevicefailure.精确
integratedcircuitsmaybemoresusceptibletodamagebecauseverysmallparametricchangescould
causethedevicenottomeetitspublishedspecifications.
ORDERINGINFORMATION
(1)
指定
packagetemperaturepackageorderingtransportmedia,
PRODUCTPACKAGEDESIGNATORRANGEMARKINGNUMBERQUANTITY
buf602idrails,75
buf602so-8d–45
°
Cto+85
°
CBUF602
buf602idrtapeandreel,2500
buf602idbvttapeandreel,250
buf602sot23-5dbv–45
°
Cto+85
°
CAWO
buf602idbvrtapeandreel,3000
(1)forthemostcurrentpackageandorderinginformation,seethepackageoptionaddendumattheendofthisdocumentorseetheti
websiteatwww.德州仪器.com.
PowerSupply
±
6.5v
直流
InternalPowerDissipationSeeThermalInformation
inputcommon-modevoltagerange
±
V
S
storagetemperaturerange:d,dbv–40
°
Cto+125
°
C
leadtemperature(焊接,10s)+300
°
C
junctiontemperature(t
J
)+150
°
C
esdrating:
humanbodymodel(hbm)2000v
chargedevicemodel(cdm)1000v
machinemodel(mm)200v
(1)stressesabovetheseratingsmaycausepermanentdamage.exposuretoabsolutemaximumconditionsforextendedperiodsmay
degradedevicereliability.thesearestressratingsonly,andfunctionaloperationofthedeviceattheseoranyotherconditionsbeyond
thosespecifiedisnotsupported.
2
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